Focused ion beam system Carl Zeiss SMT
CrossBeam

The ZEISS CrossBeam® systems deliver unrivalled accuracy for cross section and localised TEM lamella preparation in semiconductors, metals, ceramics and other bulk materials. The unique CrossBeam® systems combine the unequalled imaging power of the proprietary GEMINI® field emission column with the sophisticated high performance Focussed Ion Beam column into one extraordinary powerful system. The unique live imaging capabilities over the entire magnification range during FIB operation gives full control when working on critical samples. A range of options assures that the CrossBeam® can be configured for demanding applications. The CrossBeam® is the ultimate 3-D nanoscale analysis and inspection tool.

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