Scanning electron microscope (SEM) Carl Zeiss SMT EVO
The EVO® systems represent the latest developments in SEM technology. The new high resolution Optibeam® multi mode column with the sharp conical objective lens enables superior imaging solutions for a wide range of applications and makes the EVO® the most effective analytical SEM currently available. The new XVP® (eXtended Variable Pressure) capability exceeds the limitations of other VP and LV instruments preventing dehydration damage in life science, pharmaceutical and geo-technology applications. The EP models offer pressures up to 3000Pa enabling live imaging of dynamic processes. The future assured upgrade paths ensure that the EVO® series can develop with your applications.
