Nano level 3D profile quickly presents
Carmar’s SWIM-1510MS designs with the latest scanning white-light interferometry technology. Outstanding performance with simple operation, customer design flexibility, high-precision scanning and graphic obtaining. 3D profile and surface texture analysis can can be done by Non contact, none constructive and general Atmospheric Environment. Moreover, Nano level surface roughness of ball and step height analysis tracing the ISO International standardization.
Powerful SWIM series Whitelight Interferometer can acquire the scanning data of FOV in a few seconds. 3D profile and height inspection results obtaining is better than point to point con-focal microscope. 3D graphic measuring ability is better than stereo 2D scanning microscope.
No matter the polishing, rough layer, or even the transparent material can be inspected by SWIM as long as the reflection rate of measuring object is over 1%. SWIM is suitable for the inspections of surface profiles and micro all kinds of materials, MEMS components. The applications are as below:
Glass lens
Coating surface
Semiconductor Wafers
Data Storage Surface (HDD, DVD, CD)
MEMS Components
LCD
high-density interconnect PCB
IC Package
Micro Mechanical Parts
and analysis and surface research of other materials and Precision Machined Surface.
