Atomic force microscope (AFM)
DME - Danish Micro Engineering A/S
he scanners of the DualScope DS 95 series are available in a number of different variants. The DS 95-50 scanner has a standard scan range of 50 µm x 50 µm x 5 µm, and the DS 95-200 scanner has a standard scan range of 200 µm x 200 µm x 15 µm. The DS 95-50 scanner can also be delivered with a larger Z scan range of 15 µm. The AFM scanners work in AC and DC mode (contact and non-contact mode) as well as support the measurement of the lateral torsion of the cantilever (Lateral Force mode). Irrespective of the scan range, all scanners have atomic resolution in the Z direction.
The unique compact, modular design of this tip scanning AFM allows the integration in several DME supplied AFM stages and other setups like nanoindenters etc.
The easy plug and play cantilever mounting procedure makes high end AFM availible without being an AFM expert.
All scanners have a built-in linearization sensor in order to eliminate the influence of hysteresis in the Z piezo.
To allow measurements also in liquids, the scanner is sealed, protecting the electronics from moisture entering the housing. So these scanners can also work in liquids such as water or alcohol.
The built-in optics in these scanners is similar to that of a 95 mm microscope objective. In contradistinction to the DualScope DS 45-40 model, the focal plane is independent of the cantilever position and lies app. 1 mm below the scanner front. Thus it is especially easy to find a certain position on the sample surface.
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