High resolution atomic force microscope (AFM)
DME - Danish Micro Engineering A/S
A newly developed high resolution ultra high vacuum AFM for routine measurement, which works with standard silicon cantilevers. Sample and probe change are done via load-lock. The extreme compact sample scanner setup for samples of up to 5 mm diameter supports atomic resolution in all three dimensions. The system provides piezo controlled detector and laser adjustment as well as piezo motor based sample positioning and supports all conventional AFM and STM modes.
