Scanner for atomic force microscope (AFM) DME Danish Micro Engineering A/S

DualScope DS 45-40 is a compact, very stable, and reasonably priced AFM scanner with a fixed laser and a scan area of 40 µm x 40 µm x 2,7 µm. the working distance corresponds to that of a conventional 45 mm microscope objective. The instrument works in AC mode which is optimal for most applications. The focal plane of the optics built into the scanner is permanently app. 100 µm (standby distance) below the cantilever. Thus, focussing before the scanning is not necessary. When the cantilever is in the standby distance before the scan and between scans, it is possible to move the sample without risk, and at the same time, the scanner provides a sharp optical image of the sample surface as well as of the cantilever tip. Hereby, it is possible to find an interesting location on the sample quickly and without problems.

The scanner works with standard AC mode (Non-contact mode) cantilevers, which must have a highly reflecting back side. The cantilevers are held by a magnetic mechanism and are thus very easy to change. The routine of parking the scanner, changing the cantilever, adjusting the frequency, and starting again on the first scan line will take only app. 5 to 6 minutes.

To make possible this simple cantilever change, we deliver our cantilever pre-mounted on a metal holder. If special cantilevers are to be used, naturally, we can deliver the tools for easy mounting of the cantilevers on our metal holders.

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