Scanning electron microscope (SEM) for fiber analysis FEI Company

Fiber Analysis made Faster, Better and Easier with the FEI Fibermetric System powered by Phenom

Now, direct observation and measurement of micro and nano fibers is faster, better and easier than ever before. With the Fibermetric™ system powered by Phenom you can load and image samples in about 30 seconds. Magnifications up to 24,000 times produce accurate information on a large range of fibers as small as 100nm in diameter. Automated measurement generates all the statistical data you need in minutes, and unlike other SEM-based solutions, no laboratory infrastructure or trained microscopists are required.
The Fibermetric system accurately images and measures almost any fiber sample. The Fibermetric system delivers better data, faster, to improve your fiber material developmentand manufacturing.
- Save time
- Get all your statistical data, automatically
- See and measure nearly any micro/nano fiber

More specifications...