Scanning electron microscope (SEM) for metal analysis FEI Company
Phenom™; 20-24000x

Phenom world's first Personal SEM for Metals

Rapidly examine alloys for metallurgical analysis, quality control, and failure analysis

The properties of many engineering materials are governed by a combination of metal composition and the morphology and distribution of key micro-structural features. These features can be observed with light microscopes, but when higher magnification and 3D detail is required, a scanning electron microscope (SEM) works best. The Phenom™ personal electron microscope exceeds the resolution of light microscopes (30 nm vs. 200 nm) and eliminates the expense, delay, and difficulty of operating a conventional SEM.
Phenom takes metallurgical imaging to a new level of clarity. For failure analysis of 3D objects, Phenom's large depth of focus can show the fracture origins and fatigue features.
Phenom™ is a high-resolution personal electron microscope with an optical camera for never-lost navigation. Its innovative touch-screen user interface and control knob let you quickly produce high-quality electron microscope images-with little or no training. Phenom can handle a wide range of samples with minimal preparation. Samples are loaded instantly with our patented low vacuum load-lock technology. SEM images are ready within 30 seconds. Phenom software lets users make precise on-screen feature measurements. Images are saved on a USB memory stick or network storage location for off-line analysis and distribution.

More specifications...