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simulation software

Charged particle optics simulation software


Trak Charged Particle Toolkit TK0400

Trak 7.0 is the most advanced 2D code available on any computer platform for charged-particle optics and gun design. The program applies high-accuracy finite-element techniques to calculate single-particle orbits or to simulate steady-state beams in 2D (planar or cylindrical) electric and magnetic fields. Features include effects of beam-generated electric and magnetic fields, automatic generation of input distributions, self-consistent space-charge- limited emission, and field emission. Applications include electron and ion industrial guns, electro-optical devices, manufacturer of electron microscopes, vacuum microelectronics and relativistic high-power beams. (Requires Mesh 6.0, EStat 6.0 and PerMag 6.0.)

Features

Easy-to-understand instruction manual with a library of read-to-run examples.
Combine effects of calculated electric and magnetic fields on independent meshes.
Self-consistent space-charge-limited emission from multiple sources.
High accuracy orbit calculations, even near industrial electrode surfaces.
Precision interpolation to stopping planes for lens characterization.
Interactive orbit and field plotting postprocessor with built-in hardcopy support.
Automatic calculation of self-consistent plasma surfaces for ion extraction.
Advanced secondary- emission models and automatic tracking of multi-generational electron histories.
Automatic calculations of emittance and current density.
Formatted text output files make it easy to transfer information to user applications or to mathematical analysis programs.

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