metal analyzer / radiation / for integration / X-ray fluorescence
XRF-2000 Focused Photonics Inc.

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Characteristics

  • Measured entity:

    metal

  • Measured value:

    radiation

  • Configuration:

    for integration

  • Other characteristics:

    X-ray fluorescence

Description


Features and Benefits:
⊙ Simultaneously analyzing 28 most regular heavy metal elements, others scalable
⊙ High sensitivity, lower detection limit down to ng/m
⊙ Truly continuous and non-destructive measurement,
no pretreatment needed
⊙ No chemical, no liquid waste, reliable and less maintenance
⊙ 13 patents borne by the single analyzer
⊙ Radiation safety certified
X- rays used to expel tightly held electrons from the inner
orbitals of the atom. The removal of an electron in this way
makes the electronic structure of the atom unstable, and
electrons in higher orbitals ‘fall’ into the lower orbital to fill the
hole left behind.

Each of these transitions yields a fluorescent photon with a
characteristic radiation equal to the difference in energy of the
initial and final orbital. The fluorescent radiation is then
analyzed by separating the characteristic wavelengths
(qualitative) and detecting intensity of each characteristic
radiation (quantitive).