Atomic force microscope (AFM) FRT Fries Research Technology

FRT Atomic Force Microscopes (AFMs) scan the surface of a sample using a very fine tip on the end of a microscale cantilever.

Atomic interactions between the tip and the surface lead to a deflection of the cantilever which is then detected by a piezoresistive element. Based on this effect, the AFM can measure the topography or roughness of a surface with very high resolution non destructively. The AFM can be used in different operating modes and thus allows for the investigation of further properties, such as electrical and magnetical forces or elasticity of a specimen.

topography measurement at very high resolution
automatic approach of the tip to the surface
sampling of surface areas by means of a piezoresistive elementcontact/non-contact mode
measurement of electrical and magnetic properties
measurement of lateral forces and elasticity1
measurement in liquids2
further operating modes upon request

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