Isolated digital I/O card
A3 | A4TC | e.Series
Gantner Instruments
systems requiring precise high speed measurement of electrical,
thermal, and mechanical quantities in engine and component test
beds.
All units are based on a clean modular design, and easily connect
the wide variety of field devices used in today's test beds. Sample
rates up to 1000 Hz and resolutions up to 19 bit are possible d
pending on the module and signal type used. Standardized comm
nication protocols (Profibus-DP and Modbus
family to work with a wide variety of application hardware and sof
ware.
Adding an e.series Test Controller dramatically increases the sy
tem's throughput and connectivity options. An e.series Test Contro
ler is a data concentrator, communication gateway, and optionally a
Programmable Automation Controller (PAC) with 100Mbps Ethernet,
Profibus-DP, EtherCAT, or CANopen.
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