High resolution X-ray diffractometer 2 - 60 kV, max. 185° | XRD 3003 HR
GE Inspection Technologies
The SEIFERT XRD 3003 HR double double is a high resolution diffractometer for the structural characterization of crystalline substrates and thin films. In addition to typical applications like rocking curves, reciprocal space mapping and reflectometry the system can do the “extended Bond technique” to determine highly precise lattice parameters of even non-cubic materials. Operation in both double and triple crystal mode is possible with one experimental set-up. Samples can be perfectly aligned in an easy way by a double-tilt stage mounted to the 150 mm X/Y table.
