High resolution X-ray inspection device
23.6" x 19.7", 300 kV | v|tome|x m GE Inspection Technologies

The phoenix v|tome|x m is a versatile X-ray microfocus CT system for 3D metrology and analysis with up to 300 kV / 500 W.

Within the phoenix v|tome|x m, GE’s unique 300 kV microfocus X-ray tube is for the first time available in a compact CT system for industrial process control as well as for scientific research applications. Beyond down to < 1 μm detail detectability, the system offers industry leading magnification at 300 kV. GE’s high dynamic DXR digital detector array and the click & measure|CT automatization functionality make it an efficient 3D tool for industrial inspection and scientific research. Due to its dual|tube configuration, detailed 3D information for an extremely wide sample range is provided: from high resolution nanoCT® of low absorbing samples up to high power μCT applications such as turbine blade inspection.
Key features:

First compact 300kV microfocus CT system with < 1 μm detail detectability
Industry leading magnification at 300 kV for high absorbing samples
Unique dual|tube configuration for high power μCT as well as high resolution nanoCT®
Optimized ease of use due to advanced phoenix datos|x 2.0 CT software with automated click & measure|CT option
Optimized CT acquisition conditions and 3D metrology package with temperature stabilized X-ray tube, digital detector array and cabinet as well as high accuracy direct measuring system