The SEIFERT XRD 3003 fast in-situ is the newest XRD system from GE for the investigation of temperature dependent phase transition in the wide range of SEIFERT XRD Analyzers. Originally this system has been designed for photovoltaic in-situ applications. Three ultra-fast Meteor1D XRD detectors to cover a range in of 40° in 2Theta at one glance. The extremely short read-out time of only 0.3 ms of Meteor1D allows to take a diffractogramm every second simultaneously with the temperature correlated exactly at that time. Thus, the phase changes can be examined very exactly during the reactive temper process and temperature processes during production of photovoltaic elements can be adjusted accordingly. Additionally, the standard XRD temperature chambers for the XRD 3003 fast in-situ can be adjusted to the custom-made chamber.
