X-ray computed tomography machine / CT
nanotom® m GE Inspection Technologies


  • Options:

    X-ray, CT


Featuring the excellent innovation of phoenix nanotom®m. Designed for scientific and industrial computed tomography and 3D metrology to cater different applications. The system evaluates a unique spatial and contrast resolution varying from small biological and geological samples to medium sized industrial components. Its analysis process assures operator friendly, quick and efficient results. Enumerating its key features such as extremely high image quality, detailed detectability and long-term stability. Naming its customer advantages as it offers metrology package for stable acquisition conditions, fast reconstruction within minutes and reproducible measurement results. Best suitable to meet and to beat fast demands on different industries.


Other GE Inspection Technologies products

Radiography & CT