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GE Inspection Technologies
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X-ray diffractometer (XRD)
max. 20° | Meteor1D GE Inspection Technologies

Meteor1D is the new standard for faster measurements with one dimensional detectors. Offering extremely fast read-out time, high dynamics, largest capture angle and extreme versatility all packaged in a compact and robust design. These features fit the new 1D detector for a wide range of applications, including phase analysis, kinetic & in-situ experiments, residual stress & determination of retained austenite, and texture & thin film analysis.
Up to 20° at one glance
>170° in 2Theta possible
Cr to Mo wavelengths, high resolution
In-situ kinetic experiments
Phase, texture and stress analysis
No gas, no cooling, no Beryllium, RoHS compliant
Maintenance free, robust for 24/7 application
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