X-ray inspection machine
180 kV | nanome|x GE Inspection Technologies

The phoenix nanome|x is an ultra high-resolution nanofocus X-ray inspection system designed for inspecting high-quality assemblies and interconnections in the semiconductor and SMT industries. The system offers excellent performance and versatility and can be used for 2D X-ray inspection as well as for full 3D computed tomography (nano ct). With the new x|act software package the phoenix nanome|x is the system of choice to ensure meeting actual and future zero defect requirement
Key Features

Superior dual detector technology (digital image chain and active temperature-stabilized digital detector with 30 fps) for brilliant live images
High magnification
Precise Manipulation
High repeatability
180 kV / 15 W high-power open nanofocus tube with up to 200 nanometer detail detectability
Upgradeable to nanoCTÒ
Optional:
x|act software package for easy and fast CAD based high-resolution automated X-ray inspection (μAXI) for extremely high defect coverage with high magnification and repeatability
Brilliant live inspection images due to high dynamic temperature-stabilized digital GE DXR detector with 30 fps (frames per second) and active cooling
3D computed tomography scans within 10 seconds
Up to 2 times faster data acquisition at the same high image quality level by diamond|window