- Metrology - Laboratory
- Analytical Instrumentation
- EDXRF spectrometer
- HELMUT FISCHER GMBH - INSTITUT FÜR ELEKTRONIK UND
Fluorescence spectrometer XDAL® seriesEDXRFprocess
Add to favorites
Compare this product
Characteristics
- Type
- fluorescence, EDXRF
- Domain
- process
Description
The FISCHERSCOPE® X-RAY XDAL® is mainly designed to provide a good quality performance and functionality for very specific purposes. It is highly constructed with several PIN detectors which offer a very reliable analysis result. It is integrated with a very quick and accurate XY(Z) measuring stage which is very suitable for automatic sample measurement processes. The high quality apparatus is also built with a very long term stability which is highly determined on the decreased effort when it comes to the calibration processes.
Catalogs
No catalogs are available for this product.
See all of HELMUT FISCHER GMBH - INSTITUT FÜR ELEKTRONIK UND‘s catalogsOther HELMUT FISCHER GMBH - INSTITUT FÜR ELEKTRONIK UND products
Coating Thickness
Related Searches
- HELMUT FISCHER spectrometer
- HELMUT FISCHER laboratory spectrometer
- HELMUT FISCHER compact spectrometer
- Process spectrometer
- Benchtop spectrometer
- HELMUT FISCHER XRF spectrometer
- Conductivity meter
- HELMUT FISCHER measurement spectrometer
- Portable spectrometer
- HELMUT FISCHER fluorescence spectrometer
- HELMUT FISCHER automated spectrometer
- Portable conductivity meter
- HELMUT FISCHER EDXRF spectrometer
- R&D spectrometer
- X-ray spectrometer
- Handheld spectrometer
- Eddy current probe
- Production spectrometer
- Electronic spectrometer
- Thickness probe
*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.