High-speed LCR meter with up to 120MHz sampling
High Speed Testing of Chip Inductors and Magnetic Heads in Research and Development

Broad Frequency Measurement Range ( 100 kHz to 120 MHz )
High speed LCR testing (6ms/sample)
14 Parameter Types ( |Z|, |Y|, Θ, Rp, Rs(ESR), G, X, B, Lp, Ls, Cp, Cs, D (tan δ) and Q )
Detachable Head Amp
Load Compensation Function
BIN ( Classification ) Measurement