High-speed LCR meter with up to 120MHz sampling High Speed Testing of Chip Inductors and Magnetic Heads in Research and Development Broad Frequency Measurement Range ( 100 kHz to 120 MHz ) High speed LCR testing (6ms/sample) 14 Parameter Types ( |Z|, |Y|, Θ, Rp, Rs(ESR), G, X, B, Lp, Ls, Cp, Cs, D (tan δ) and Q ) Detachable Head Amp Load Compensation Function BIN ( Classification ) Measurement
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