Inductance, capacitance and impedance meter
100 kHz - 120 MHz | 3535
HIOKI
High-speed LCR meter with up to 120MHz sampling
High Speed Testing of Chip Inductors and Magnetic Heads in Research and Development
Broad Frequency Measurement Range ( 100 kHz to 120 MHz )
High speed LCR testing (6ms/sample)
14 Parameter Types ( |Z|, |Y|, Θ, Rp, Rs(ESR), G, X, B, Lp, Ls, Cp, Cs, D (tan δ) and Q )
Detachable Head Amp
Load Compensation Function
BIN ( Classification ) Measurement
High Speed Testing of Chip Inductors and Magnetic Heads in Research and Development
Broad Frequency Measurement Range ( 100 kHz to 120 MHz )
High speed LCR testing (6ms/sample)
14 Parameter Types ( |Z|, |Y|, Θ, Rp, Rs(ESR), G, X, B, Lp, Ls, Cp, Cs, D (tan δ) and Q )
Detachable Head Amp
Load Compensation Function
BIN ( Classification ) Measurement
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