Transmission electron microscope (TEM) Hitachi High Technologies Europe GmbH

With 11 accessory ports and optional simultaneous WDX, EDX and XRF analysis, the S-3700N is a true analytical instrument for ultra-large samples up to 300 mm across.

The patented Quad bias electron gun gives high current for excellent imaging and analytical performance throughout the kV range, but particularly at low voltages.

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