Analytical field emission scanning electron microscope (FE-SEM)
Hitachi High-Technologies Europe
Sophisticated performance in Ultra-High-Resolution and Analysis
We are proud to present our NEW versatile solution for analytical purposes in combination with Ultra-High-Resolution and ample Signal Selection capabilities .
The SU-70 combines two electron-optical modes in one instrument: Hitachi's famous semi-inlens optics with ExB signal filtering & detection, and a field-free mode with no magnetic field between sample and objective lens. In both modes the system delivers breath-taking probe currents up to 200nA and an impressing Low kV-resolution for upcoming conceptual formulations.
Get convinced by this performance regarding to our Hitachi "semi-in-lens"-concept and the Field-Emission-Schottky-Gun. Take advantage of this uncompromising Scanning Electron Microscope (SEM).
The SU-70 invites you to do the next steps in the nanoworld!