Holography field emission scanning transmission electron microscope (FA-STEM)
HF-3300 Hitachi High-Technologies Europe

The HF-3300 is an advanced 300kV TEM/STEM that complements Hitachi's rapidly expanding range of high-end material science instruments. The HF-3300 features cold field emission gun technology which delivers superior spectroscopic performance with outstanding electron holography capabilities. Double-biprism electron holography can be used for dopant mapping and magnetic and dielectric materials study. Designed primarily for work on materials science, the HF-3300 has excellent mechanical and electrical stability. It offers the versatility to allow researchers to push the limits of electron microscopy with imaging and analysis of extremely difficult samples at sub-Angstrom resolution. This instrument provides a comprehensive range of imaging and analytical techniques. These include high resolution TEM imaging in both conventional (parallel beam) and scanning (STEM) modes, and high-energy resolution, highly spatially resolved Electron Energy Loss Spectroscopy (HREELS) with ~ 0.2 nm probe size and high beam current. HREELS allows instant multipoint compositional and chemical binding state analyses. Versatile simultaneous signal collections include: HAADF/BF, HAADF/SE, SE/BF and HAADF/EELS. Other capabilities include off-axis electron holography, three beam interferometry and STEM holography. Since the CFEG source allows for parallel beam work with very small probe sizes electron diffraction can be carried out both in parallel nano-beam and convergent beam modes.