High precision form and surface measuring machine
nanoscan 855
HOMMEL-ETAMIC
HOMMEL-ETAMIC nanoscan 855
Roughness and contour measurement with maximum precision
The nanoscan 855 uses an extremely advanced technologically innovative opto-mechanical measuring system.
Tactile workpiece scanning is transmitted to an optical scale by a high-precision mechanical pick-up which is then interpreted by a laser interferometer. This innovative design makes the nanoscan 855 the measuring system of choice for high precision applications.
Maximum performance in simultaneous measurement of roughness and contour
Technologically innovative
* Electronic probe arm detection The probe arms are detected electronically and automatically assigned to each measuring task. This eliminates measuring errors due to incorrect probe arms.
* Electronic stylus tip protection device (patent pending) Damage to the stylus tip is eliminated using an electronic speed limiter to prevent abrupt contact with the workpiece.
* Electronic probe force setting Probe force can be electronically adjusted,
depending on the stylus tip, to avoid measuring errors or stylus tip damage.
* High-precision probe arm positioning For small bore measurements or automatic measurement of surfaces with interruptions.
Roughness and contour measurement with maximum precision
The nanoscan 855 uses an extremely advanced technologically innovative opto-mechanical measuring system.
Tactile workpiece scanning is transmitted to an optical scale by a high-precision mechanical pick-up which is then interpreted by a laser interferometer. This innovative design makes the nanoscan 855 the measuring system of choice for high precision applications.
Maximum performance in simultaneous measurement of roughness and contour
Technologically innovative
* Electronic probe arm detection The probe arms are detected electronically and automatically assigned to each measuring task. This eliminates measuring errors due to incorrect probe arms.
* Electronic stylus tip protection device (patent pending) Damage to the stylus tip is eliminated using an electronic speed limiter to prevent abrupt contact with the workpiece.
* Electronic probe force setting Probe force can be electronically adjusted,
depending on the stylus tip, to avoid measuring errors or stylus tip damage.
* High-precision probe arm positioning For small bore measurements or automatic measurement of surfaces with interruptions.
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