190 - 2 100 nm | UVISEL
The UVISEL ellipsometer is efficiently engineered to deliver exceptionally accurate spectroscopic parameters in an array of applications. It combines excellent modularity with high performances to provide superlative surface, interface and thin film classification.
The ellipsometer harnesses the principle of phase modulation, to provide potent optical services in relentlessly tracking the 145 to 2100 nm spectral range. The data garnered across the entire monitored spectral field displays brilliant exactitude, outstanding signal-noise ratio and ultra-high resolutions.