Spectroscopic ellipsometer

spectroscopic ellipsometer
spectroscopic ellipsometer
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spectroscopic

Description

Horiba offers a large range of solutions for thin film quality control. Wide array of ellipsometer like in-situ and in-line are used in controlling processes in research and in industry. From thin film monitoring to large area mapping and in-line characterization of flexible devices. In-situ spectroscopic ellipsometers permits real-time monitoring and controlling of thin film deposition with a sub-monolayer resolution. It provides real-time estimation of film thickness and optical constants.

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Exhibitions

Meet this supplier at the following exhibition(s):

ACHEMA 2024
ACHEMA 2024

10-14 Jun 2024 Frankfurt am Main (Germany)

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