Scanning probe microscope (SPM) Imago Scientific Instruments

The LEAP HR is a high-performance atom probe microscope providing atomic resolution, 3D compositional imaging, and analysis to research and industry. Materials are examined by removing and analyzing individual atoms. Atoms are removed by a combination of a high electrical field and either: (1) an ultra-fast voltage pulse or (2) an ultra-fast laser pulse. Each ion is analyzed by measuring the time of flight to the detector through an energy-compensated time-of-flight mass spectrometer. The LEAP HR employs patented innovations that provide best in class mass resolution while simultaneously enabling a large field of view (> 150 nm). This combination of high mass resolution with large field of view provides breakthrough capability for advanced materials applications. The large field of view enables the material’s atomic scale features to be understood in the context of the larger scale nanostructure. High mass resolution permits narrowly separated mass peaks to be differentiated, ensuring accurate compositional information.

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