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scanning probe microscope

Scanning probe microscope with ultra-fast laser pulse


Laser Pulsing Mode expands the universe of applications for LEAP to low electrical conductivity materials including semiconductors and ceramics. In laser pulsing mode the LEAP electrode applies a static field to the specimen while an ultra-fast laser pulse triggers the removal of an atom. The Imago Laser Pulsing Module features a high pulse-repetition rate and proprietary real-time, optical-alignment correction which together enable high mass resolution, a large field of view, and fast time to results.


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