High resolution X-ray diffractometer EQUINOX 6000
INEL
The Equinox 6000 is a multi purpose X-ray diffractometer designed specifically for high level research applications. The system utilizes an unique tall vertical goniometer in θ/θ or θ/2θ mode with an attached high precision Eulerian cradle. It is the perfect diffraction system for materials science including thin layer analysis, reflectometry, micro diffraction, residual stress analysis, texture measurements. Data is measured in "real time", which present many advantages in kinetics experiments or combined analyses.
