loading in progress... Please wait

www.innolas.com
Selected product 
test system

Wafer test set


General description:

The InnoLas wafer sorting system IL 2600 can automatically sort, split merge and transfer wafer from any slot / cassette to any other slot / cassette in a six cassette array.

Wafer sizes from 100 mm to 200 mm can be handled without any mechanical adjustment in a single or multi-batch operation.

The laser mark code read for verification can be located at any position on the front and/or backside of the wafer.

The basic model has one reading unit (OCR, BC412, T7) for reading the laser code on the frontside of the wafer.

A second reading unit (OCR, BC412, T7) for reading the code on the backside of the wafer can be mounted as an option.


More specifications...

Other products from -

InnoLas

 
back

soc-pmea www di En 2009-11-48-26