Instrument Systems

Source and measure unit for led production tests
LSM 350 Instrument Systems

The LSM 350 source and measure unit was specifically developed to meet the requirements for production testing of LEDs and LED wafers. This allows all the important parameters of LEDs to be determined quickly and reliably.

Features

* Very short test cycles and parallel electrical measurements
* 0 – 350 mA; 0 – 8 V
* Up to 4 test channels with optional switch matrix
* Dedicated test channel for μA range
* Measurement of breakdown voltage up to 40 V

The current and voltage source is based on a modular concept. The basic 1-channel unit already integrates all the necessary characteristics in a chassis model.

Specifically short settling times provide up to 40% shorter test cycles in comparison to most standard current sources. Automatic polarity identification and reversal ensure that current is supplied to the LED with correct polarity, irrespective of single or multi-chip LED. Dedicated measurement ranges permit particularly precise testing at low forward currents of 1 µA, and measurement of reverse currents in the nA range. All test channels have been designed for 4-wire measurements. Further options facilitate measurement of breakdown voltage up to 40 V.

The LSM 350 shows its special strength when several channels are used for measuring multichip LEDs. Electrical measurements are carried out at precisely the same time on all dies.
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