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All Jeol products

Transmission electron microscopes (TEM)

Scanning electron microscopes (SEM)

Sample preparation equipment

Electron probe microanalyzer (EPMA)

Auger microprobe

Photoelectron spectrometer (ESCA)

Multibeam system (FIB)

X-ray fluorescence spectrometers

Nuclear magnetic resonance

Electron spin resonance

Mass spectrometers

Electron beam lithography

Thin Film Production Equipment (E-Beam and Plasma Sources, etc.)

Material Production Equipment (For Metal Melting and Nanopowder Synthesis, etc.)