Jeol

Digital polisher for sample preparation
IB-09010CP Jeol

* For samples too sensitive for mechanical polishing
For soft, hard, and composite samples
* Excellent mirror finish
Minimum distortion of samples; ideal for preliminary processing of samples for crystal orientation analysis (EBSD)
* Large cross sections 1 mm wide
Suitable for failure analysis of plated items and electronic devices
* Easy to use operation panel
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