Ion beam cross section polisher for sample preparation
Jeol

New cross section polisher from JEOL allows observation of multi-layer structures, interfaces, composites of soft and hard materials, polymers, powder grains, and crystalline structures of metals and ceramics with few artifacts. In a single step, clean, polished samples are produced and for analysis. The CP uses an argon ion beam to prepare up to 11mm(W) x 10mm(D) x 2mm(H) samples of soft or hard materials while preserving internal structures, voids between interfaces, adhesions between layers, and precipitates. Unlike conventional mechanical polishers, the CP minimizes deformation of the polished surface, enabling clear observation of crystalline structures.
The high power optical microscope in the JEOL CP allows the user to position a sample to within a few microns of the cross section position. During milling, the sample is rocked automatically to avoid creating beam striations on the cross sectioned surface. Due to the glancing incidence of the ion beam, argon is not implanted into the sample surface.