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laboratory microscope / scanning transmission electron / floor-standing / high-resolution
JEM-ARM300F Jeol

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Characteristics

  • Technical applications:

    laboratory

  • Type:

    scanning transmission electron

  • Ergonomics:

    floor-standing

  • Other characteristics:

    high-resolution

  • Resolution:

    0.058 nm, 0.063 nm

Description

JEM-ARM300F GRAND ARM is an Atomic Resolution Electron Microscope offering a maximum accelerating voltage of 300 kV, and equipped with JEOL’s own Cs Correctors. This instrument guarantees an unprecedented STEM-HAADF image resolution of 58 pm.

JEOL’s proprietary STEM Cs Correctors delivers a guaranteed resolution of 58 pm for scanning transmission electron microscopy images (STEM images) (accelerating voltage 300 kV) *1 (when the STEM spherical aberration corrector is configured).