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analysis microscope / electron
JEM-1400Flash Jeol

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analysis microscope / electron analysis microscope / electron - JEM-1400Flash
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Characteristics

  • Technical applications:

    for analysis

  • Type:

    electron

  • Resolution:

    0.14 nm, 0.2 nm

  • Magnification:

    Min.: 10 unit

    Max.: 1,500,000 unit

Description

The JEM-1400Flash is used in a wide range of fields, such as biology, nanotechnology, polymer, and advanced materials. In the observation of biological specimens including macro-molecular materials, medicines, pathological sections and viruses, usually the entire view of tissues, structures, target locations and observation area are first confirmed at low magnification, and then fine structures of interest are carefully studied at high magnification. To smoothly proceed to this series of observation, recent demands for easier observation steps to acquire higher-throughput image data are increasing. To meet those needs, a new 120 kV electron microscope “JEM-1400Flash” is equipped with a high-sensitivity sCMOS camera, an ultra-wide area montage system, and an OM (optical microscope) image linkage function.