SEM microscope JSM-IT200 InTouchScope™
for analysisCCDautomatic

SEM microscope
SEM microscope
SEM microscope
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Characteristics

Type
SEM
Technical applications
for analysis
Detector type
CCD
Other characteristics
automatic, real-time

Description

JSM-IT200 is an easy-to-use SEM focused on cost performance of high functionalities of JSM-IT500 (higher-end model) of InTouchScopeTM, with significantly higher throughput. Specimen Exchange Navi, a beginner-friendly function, offers guided operation from sample loading to area search, and SEM image observation. “Zeromag” for seamless transition from optical to SEM imaging, “Live Analysis”*2 for real time display of elemental analysis results, SMILE VIEW(TM) Lab for seamless report generation of observation and/or analysis results, etc., provide fast analysis with integrated transition from OM to SEM. Fast observation, analysis and report generation! JEOL InTouchScope™ series, the high performance analytical tool with major three functions. Specimen Exchange Navi: Guided operation from sample introduction to observation A step-by-step guide to sample exchange, condition setting and automatic imaging. Fast observation! "Zeromag" You can locate the specimen area or specify analysis positions with Holder Graphics or Optical CCD image*1 displayed on the Main screen. Fast analysis! "Live Analysis"*2 The characteristic X-ray spectrum from the measurement area and the main constituent elements are displayed during observation. Fast report generation! SMILE VIEW™ Lab: integrated data management Single-click of the data management button displays the Data management screen, allowing you to generate a report of all images and analysis data, as well as review or re-analyze already-acquired data.

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