Scanning electron microscope (SEM) Jeol

JEOL has played a leading role in the development and evolution of scanning electron microscopy since the early 1960s. Over the past five decades, the SEM has become an indispensable tool in both advanced research and routine analysis for science and industry. JEOL has installed more than 8000 SEMs worldwide.

SEMs are continually finding new applications in nanotechnology, where nano-fabrication techniques are so advanced that new SEM technology has been developed to help researchers to see the structures they make. More and more failure analysis, pathology, forensic, metallurgical and environmental labs are replacing traditional optical microscopes with SEMs.

As the range of applications for the SEM grows -- and as new discoveries require higher resolutions and greater versatility -- JEOL keeps pace with new technology that enables the SEM user to produce unprecedented images of the microscopic and nanometric world.

Our SEM product line is comprised of four categories differentiated by resolution and configuration:

Conventional Tungsten High Vacuum SEMs: ideal for failure analysis, inspection, and characterization.

Conventional Tungsten Low Vacuum SEMs: for imaging and X-ray analysis of wet, nonconductive, unprepared samples.

Conventional Thermal Field Emission SEMs: field emission source provides higher resolution; high stability and high current in a small spot size and generates high x-ray fluxes for chemical analysis at high resolution conditions.

Semi-in-Lens Cold Cathode Field Emission SEMs: highest resolution SEMs; the cold cathode produces the finest probe size, especially at low accelerating voltages; the semi-in-lens pulls the secondary electrons off the surface by a detector in the objective lens, reducing noise at lower working distances.

More specifications...