Scanning probe microscope (SPM)
Jeol

The Scanning probe Microscope (SPM) was developed during the 1980s and is now an indispensable tool for the direct high resolution study of surfaces and surface forces. Starting with the scanning tunneling microscope in 1981, the technique was broadened to atomic force microscopy including contact, non-contact, and discrete contact modes by 1988. By changing the force-sensing probe it is possible to detect magnetic forces, electrical forces, frictional forces, surface elasticity, and visco-elasticity, etc. The SPM is currently being used to study samples ranging from semiconductor surfaces and devices, thin films, archeological artifacts, compact discs, computer hard drives, magnetic media, electrical properties of materials, biological materials, to name a few.

Our SPM product line is comprised of the following offerings:

JSPM-4500 Scanning Probe Microscope: designed for the high resolution study of surfaces.

JSPM-5200 Environmental Scanning Probe Microscope: a multipurpose, high resolution SPM offering ease of use with diverse measurement and sample environments.

JSPM-5400 Environmental Scanning Probe Microscope: a multipurpose, high resolution SPM offering ease of use with diverse measurement and sample environments.