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Scanning probe microscope (SPM)
JSPM-5410 Jeol

  • scanning probe microscope (SPM) JSPM-5410 Jeol
The JSPM-5410 is a powerful and versatile scanning probe microscope that is also easy-to-use. The JSPM-5410 offers high-speed, non-damaging scan control, simple positioning, high resolution imaging, and stable observation of heated/cooled samples in high vacuum.

The JSPM-5410 patented, non-contact AFM, utilizes a constant excitation amplitude FM detection method (JEOL patent) which enables high-accuracy surface-potential imaging as well as high resolution imaging in a vacuum, the result of which is no air resistance and no adsorption of impurities
on sample surfaces decreases.

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