JEM-2100F is a next-generation, flexible TEM that simplifies atomic-level structural analyses in biology, medicine and materials sciences as well as the semiconductor and pharmaceutical industries.

Designed for all advanced EM techniques including ultrahigh resolution TEM, electron diffraction, cryo-EM, in-situ microscopy, holography, and tomography; ideally suited for crystallographic and chemical analyses at a sub-nanometer scale, including high-sensitivity EELS and EDS. Features include a high-brightness Schottky field emission electron gun producing a probe size of less than 0.15nm. Ultra-high point-to-point TEM resolution is guaranteed at 0.19nm, and atomic scale resolution of 0.136nm can be achieved using High Angle Annular Dark Field (HAADF) STEM imaging to directly reveal atomic position and detail. The JEM-2100F presents new microprocessing and networking capabilities to streamline communications for rapid data acquisition and transfer. The Windows OS interface makes operation easy and intuitive. To perform atomic-level stage movements, the JEM-2100F features a tension-free specimen holding system and a five-axis, LoDriftTM goniometer stage. Drift is guaranteed at less than 0.2nm/min. JEM-2100F supports robust TEM technology based on proven industry standards.