3D laser scanning microscope
VK-X
Keyence Deutschland
to overcome conventional technologies for picture giving and profile measurement. A short wave laser scannt over the sample surface and supplies data to profile processes, roughness and thickness of layers. Even strongly tapered surfaces do not represent an obstacle. The combination of a short wave laser with an outstanding 16-bit photomultiplier makes possible for you with the VK-X to seize both pictures and measuring data from nearly any material to to accomplish and thickness measurements of transparent layers or coatings.
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