Orientation measuring system YH-2H8
X-ray

orientation measuring system
orientation measuring system
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Characteristics

Measured physical value
orientation
Technology
X-ray

Description

YX-2H8 Model Big Crystal Bar Orientation Instrument is designed for multiple crystal l(single crystal silicon, sapphire, gallium etc) based on standard orientation instrument, mainly used for measurement of crystal round plate, crystal bar, its displayer put outside, adds bearing rail on sample table. Standard configuration: GA, GC angular instrument One surface of GA angular instrument can measures¢2-8inches diameter crystal round plate, for example, angle of silicon (111) sapphire C surface; at the same time it can measures reference or OF surface of crystal bar, such as for angle of silicon (110) sapphire A surface and other crystal. The other surface of GC angular instrument can measures crystal bar end surface, operator can measure ¢5-8nches diameter,500mm length crystal bar end surface by changing width of roll bar. For example: angle of silicon (111,100) sapphire C surface and other crystal. It can also measures crystal round plate.

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X-ray Orientation Instrument

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