Surface roughness tester MarSurf XR 1

benchtop

Easily measure roughness and waviness The ideal instrument for a low-cost introduction to user-friendly surface metrology. The PC-based instrument delivers all common thread parameters and profiles in accordance with international standards, both in the measuring room and in production. MarSurf XR 1 from Mahr stands for the future-oriented roughness system. • Over 80 surface parameters for R-, P- and W-profiles as per current standard ISO/JIS or MOTIF (ISO12085) • Bandpass filter Ls in accordance with current standard; Ls can also be switched off or varied as required • Comprehensive measuring records • Quick&Easy measuring programs can be created quickly using teach-in methods • Automatic function for choosing cutoff and traversing length • Support for various calibration methods (static and dynamic) by specifying the Ra or Rz parameter • Adjustable maintenance and calibration intervals • Multiple measuring station configurations are available for custom applications • Range of options provide system flexibility • Various user levels protect the device against misuse and prevent unauthorized people from using it • Different drive units or devices can be connected simultaneously to MarSurf XR 1