Contour measuring machine MarSurf LD series

roughnessparts

Highest precision for roughness and contour with 130 mm measuring path Combined contour and roughness measurements in just one step comes courtesy of proven cutting-edge technology from Mahr metrology. The MarSurf LD 130 and MarSurf LD 260 measuring stations have been systematically developed to draw on the experience from the first generation of equipment. Measuring tasks in different applications increasingly require the determined contour and roughness depth to be combined. The measuring instruments must demonstrate enormous measuring performances to meet these requirements. Resolutions in the sub-nanometer range and residual noise of <20 nm Rz are just some of the required basic conditions. • Roughness and contour in one step • High measuring and positioning speed minimizes measuring times dramatically • Innovative probe system solution • Quick and reliable replacement of the probe arms with simultaneous probe arm detection by magnetic holder • Long measuring length up to 130 mm with a measuring length of 13 mm (at 100 mm probe arm length) or 26 mm (with 200 mm probe arm length) • Modular construction for ease of maintenance