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X-ray diffractometer
Aeris Malvern Panalytical

Characteristics

  • Options:

    X-ray

Description

Meet Aeris – our brand-new X-ray benchtop diffractometer. Aeris will impress you with data quality and speed of data acquisition so far only seen on full-power systems. The instrument is accessible for everyone with its built-in touch screen and intuitive software. Being a PANalytical product guarantees delivery of the best benchtop data and full automatability for industrial applications. Aeris is designed for low cost of ownership and is available in 4 editions tailored to the needs of specific markets: the Cement, Minerals, Metals and Research editions.

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