• Numerous adjustable parameters • Perfect repeatability of test scenarios • Trace visualization & analysis • Advanced measurements capabilities • Injection of perturbations in the dialog • Support of ISO 7816-3 (T=0 and T=1) USB 2.0, SHDLC/SWP Profiting of years of experience in smart cards testing, the MP300 TC3 is the most complete and accurate tool for smart card developers. Obviously, all standard smart card protocols are supported, from standard ISO 7816-3 to SWP/SHDLC, including synchronous and out of standard protocols. To stress the smart card or the application, every parameter is adjustable: guard and waiting times, electrical levels, data rate, rising and falling edges and more. The glitch generator will be used to conduct attacks in order to test tamper resistance. SWP and ISO 7816 communication channels can be used simultaneously, featuring synchronous or random testing. Driven by the new MPManager software, test script creation and execution has never been so easy. Shmoo plots, static and dynamic measurements, timing and conformance analysis are some of the functions provided. And if you prefer to include the MP300 TC3 in your own test environment, keep in mind that the MP300 is an open family, all the necessary tools and documentation are provided.