In-line magnetic thickness measuring instrument
max. 1.7 T | DiskMapper M3
MicroSense, LLC
Benefits:
Patented recording layer Mrt measurement is independent of the soft under layer (SUL), providing unique feedback to control the uniformity of media properties
Perpendicular write head with maximum field exceeds current production requirements for the characterization of Mrt, Hr and Hnr
Universal read and write heads allow easy conversion between all industry-standard media sizes
Non-contact, non-destructive mapping provides feedback to minimize variation of magnetic properties over the disk surface








