Miniature tensile/compression testing machine for scanning electron microscope (SEM)
MTI Instruments
MTII recently acquired the Fullam brand of miniature tensile, compression and bend testing machines specifically designed for use in Scanning Electron Microscopes (SEMs), Atomic Force Microscopes (AFMs) and Light Microscopes (LMs). The dual leadscrew design symmetrically loads samples while keeping them centered within the scope's field of view. 100 and 1000 pound versions are standard with a wide range of sample clamps, bending fixtures (3 and 4 point) and compression anvils. Custom mounting adapters are available for integration into virtually all major microscopy tools. Optional heaters and thermoelectric heater/coolers are also offered for testing under low and high temperature conditions. Tensile testers have also been designed for Xray Diffraction systems, nuclear accelerators, inverted light microscopes, corrosive environments and immersed specimens. Many custom features, including 2000 pound load frames, are available to order
